CAFM NANOSCALE ELECTRICAL PROPERTIES AND RELIABILITY OF HFOZ BASED GATE DIELECTR

CAFM NANOSCALE ELECTRICAL PROPERTIES AND RELIABILITY OF HFOZ BASED GATE DIELECTR

IGLESIAS SANTISO, VANESSA

26,00 €
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Editorial:
UAB-UNIVERSIDAT AUTONOMA BARCELONA
ISBN:
978-84-490-3368-1
26,00 €
IVA incluido
Consulta disponibilidad