CAFM NANOSCALE ELECTRICAL PROPERTIES AND RELIABILITY OF HFOZ BASED GATE DIELECTR

CAFM NANOSCALE ELECTRICAL PROPERTIES AND RELIABILITY OF HFOZ BASED GATE DIELECTR

IGLESIAS SANTISO, VANESSA

26,00 €
IVA incluido
Available in 1 week
Publishing house :
UAB-UNIVERSIDAT AUTONOMA BARCELONA
ISBN:
978-84-490-3368-1
26,00 €
IVA incluido
Available in 1 week